MIGDAL HAEMEK, Israel,
August 19, 2015 /PRNewswire/ --
Jordan Valley announces the selection of
their advanced JVX7300RF-W,
by a world leading process
equipment manufacturer. The tool was
selected following extensive evaluation of
tool capability, performance and
productivity for development and
customers' demonstration of advanced wafer
level packaging and thin-film applications.
Jordan Valley, a leading supplier
of X-ray based in-line metrology systems for advanced semiconductor
manufacturers, today announced that it received an order from a
market-leading equipment manufacturer, selecting the new
JVX7300RF-W metrology system for advanced process development and
control.
The JVX7300RF-W system offers invaluable in-line metrology
combining both small spot XRF and first principle XRR and providing
solutions for multilayer complex 2D and 3D metal stacks, as well as
ultra-thin layers (<10Å) and small pads or micro-bumps.
The JVX7300RF-W delivers high ROI and low CoO for its inline
metrology of next generation Wafer Level Packaging (WLP) advanced
micro-bump process development and control, allowing high
throughput non-destructive thickness and composition
measurements.
JVX7300RF-W is the successor to the production proven JVX6200iRF
with extended capabilities and significant productivity
improvements. The 7300RF-W allows metrology on smaller features
necessary to adhere to the industry roadmaps and the WLP segment's
unique needs among others.
"This order marks the true need of JVX7300RF-W for the
development and control for advanced WLP and other thin-films"
stated Asaf Shlomo, Jordan
Valley's Product Marketing Manager. "This engagement from a
leading equipment manufacturer is further acknowledgement of the
high value of the JVX7300RF-W tool to provide advanced WLP and
plating process metrology solutions," added Shlomo.
Isaac Mazor, Jordan Valley CEO,
noted, "We are proud of this win, to be part of center of
excellence of another leading supplier, where we will demo our tool
as part of advanced tool set for our mutual customers."
About the JVX7300RF-W production
metrology tool.
The JVX7300RF-W is a production worthy X-ray metrology tool
combining small-spot XRF and XRR measurement channels. The tool
targets both FEOL applications for nodes at 20nm and lower, and
advanced WLP manufacturing. The tool is configured for full fab
automation and is SEMI S2/S8 and CE certified.
About Jordan Valley Semiconductors Ltd.
Jordan Valley Semiconductors (JVS) is the leader in X-ray
metrology and defect detection tools for the semiconductor
industry. Jordan Valley's tools are
fully automated non-contacting and non-destructive tools designed
for production control on patterned or blanket wafers.
The company offers the semiconductor industry the most
comprehensive portfolio of advanced metrology and defect inspection
tools, based on X-ray technologies such as XRR (X-ray
reflectometry), XRF (X-ray fluorescence), XRD (X-ray diffraction)
and others.
Jordan Valley's investors include
Clal Industries and Investments Ltd. (TASE: CII), Intel Capital
(NASDAQ: INTC) and Elron Electronics Industries Ltd. (TASE: ELRN).
With headquarters in Migdal Haemek, Israel, the company has subsidiaries in
Durham UK, Austin TX USA, Hsin-Chu
Taiwan, Suwon Korea and other offices and sales representatives
worldwide.
For more information:
Asaf Shlomo
Product Marketing Manager
Tel: +972-4654-3666
asaf.shlomo@jordanvalley.com
http://www.jvsemi.com
SOURCE Jordan Valley