Aehr Test Systems to Present at LD Micro Main Event Conference on October 12 and Discuss Expanding Silicon Carbide Test Market Opportunity for Electric Vehicles and Electrification Infrastructure
October 06 2021 - 7:30AM
Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of
semiconductor test and reliability qualification equipment, today
announced that CEO and President Gayn Erickson will be presenting
at the 14th Annual LD Micro Main Event Conference on Tuesday,
October 12, 2021 at 3:30 pm PT at the Luxe Sunset Bel-Air in Los
Angeles, and will be meeting with investors throughout the day.
Register to watch the virtual presentation here.
“We look forward to discussing our semiconductor wafer level and
singulated die test and burn-in solutions and the markets they
serve with investors,” said Mr. Erickson. “Aehr Test provides
complete production solutions for improving yield and reliability
of semiconductors, and devices such as silicon carbide
semiconductors used in electric and hybrid electric vehicles,
silicon photonics devices used in data centers and 5G
infrastructure, and 2D/3D and other sensors used in mobile and
wearable applications, which are expected to be significant revenue
drivers for our products this fiscal year and next.”
Chris Lahiji, Founder of LD Micro, stated, “Aehr Test is a
perfect example of what we look for when it comes to our presenting
companies, managerial discipline, diligence, and disruptive
technology. Over the past year, the Company has landed on a few
radar screens and finally received the recognition and
acknowledgment it deserves. We look forward to hosting them, and
updating our investor community on their developments with great
interest and excitement."
The 2021 LD Micro Main Event will be held from Tuesday, October
12th to Thursday, October 14th. The conference runs from 8 am PT -
5:30 pm PT on the 12th and 13th with a morning session on the 14th.
This three-day investor conference is expected to feature around
150 companies, presenting for 25 minutes each, as well as several
influential keynotes in person. For more info, please contact
Dean@ldmicro.com
About LD Micro LD Micro aims to be the most
crucial resource in the micro-cap world. Whether it is the index,
comprehensive data, or hosting the most significant events on an
annual basis, LD's sole mission is to serve as an invaluable asset
for all those interested in finding the next generation of great
companies http://www.ldmicro.com.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has installed over 2,500 systems worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTSTM and FOX-PTM
families of test and burn-in systems and FOX WaferPakTM Aligner,
FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak
Loader. The ABTS system is used in production and qualification
testing of packaged parts for both lower power and higher power
logic devices as well as all common types of memory devices. The
FOX-XP and FOX-NP systems are full wafer contact and singulated
die/module test and burn-in systems used for burn-in and functional
test of complex devices, such as leading-edge memories, digital
signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The FOX-CP
system is a new low-cost single-wafer compact test and reliability
verification solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The WaferPak
Contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.
Contacts: |
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Aehr Test Systems |
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MKR Investor Relations Inc. |
Ken Spink |
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Todd Kehrli or Jim Byers |
Chief Financial Officer |
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Analyst/Investor Contact |
(510) 623-9400 x309 |
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(323) 468-2300 |
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aehr@mkr-group.com |
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