Bede X-ray Metrology to ship BedeScan™ X-ray Defect Detection and Inspection system to Nippon Steel Technoresearch Corporation (NSTR) - 05 Dec 2006
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Bede X-ray Metrology ships BedeMetrix™-F with ScribeView™ to a leading US semiconductor manufacturing consortium - 09 Nov 2006
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Bede X-ray Metrology and IMEC collaboration on process control of new materials used at 45nm nodes and below - 25 Aug 2006
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Bede X-ray Metrology wins BedeMetrix™-L order from Tokyo Electron America, Inc - 28 June 2006
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