Advantest's Newest Memory Tester, Model T5372, Reduces DRAM and Flash-Memory Test Times by 30 Percent

Date : 04/07/2005 @ 3:10PM
Source : PR Newswire
Stock : Advantest (Kab) Ads (ATE)
Quote : 22.8  0.06 (0.26%) @ 11:03AM
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Advantest's Newest Memory Tester, Model T5372, Reduces DRAM and Flash-Memory Test Times by 30 Percent

Advantest's Newest Memory Tester, Model T5372, Reduces DRAM and Flash-Memory Test Times by 30 Percent

TOKYO, April 7 /PRNewswire-FirstCall/ -- Advantest Corporation (TSE:6857)(NYSE:ATE), the world's largest supplier of semiconductor test equipment, today announced global availability of its newest memory tester. The Model T5372 reduces wafer test time by more than 30 percent for dynamic random-access memory (DRAM), synchronous DRAM (SDRAM), double-date-rate (DDR)-SDRAM, flash-memory and other general-purpose memory chips, as well as for multi-chip packages (MCPs) and other specially packaged memories.

Building on the demand for PCs and cellular phones, the market for semiconductors for use in personal digital assistants (PDAs) and consumer electronics has exploded in recent years and continues to grow rapidly.

However, competition for consumer dollars is also intensifying. When electronics manufacturers seek to enhance the competitiveness of their products by adding functionality, improving performance and cutting prices, makers of memory devices for these products must also boost speed and memory capacity while improving cost performance. Moreover, the impressive variety of consumer-electronics products now reaching the market demands an increasing variety of specialized memory device packages. Production lines assembling these chips, as well as high-mix/low-volume production lines, require highly efficient, low-cost test solutions.

Advantest's new T5372 offers test speeds of up to 143 MHz / 286 MHz (in DDR mode) -- double those of its predecessor, the T5371 -- enabling it to support increasingly high-speed devices. Its optional failure analysis functions include a Fail Bit Compress Engine (which accelerates the transmission of failure data) and Address Fail Memory (which allows dual-mode operation of partitioned failure memory). These features enable the T5372 to cut wafer test times by approximately 30 percent, reducing cost of test.

Able to test up to 128 devices in parallel, the T5372 is available with one or two test stations, each of which features a maximum of 32 DC units and 128 programmable power sources. The T5372 also retains compatibility with the T5371 and can therefore be used with existing customer assets, including test programs and probe cards, enabling a seamless upgrade.

About Advantest

Advantest Corporation is the world's largest supplier of automatic test equipment to the semiconductor industry. Advantest's SoC, logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982 and its European subsidiary in 1984. More information is available at http://www.advantest.com/ .

DATASOURCE: Advantest Corporation

CONTACT: Amy Gold of Advantest America, Inc., +1-212-850-6670, or

; or Ellen Van Etten of MCA, +1-650-968-8900, or

, for Advantest Corporation

Web site: http://www.advantest.com/

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