FEI Launches Apreo – Industry-Leading Versatile, High-Performance SEM
May 03 2016 - 8:15AM
FEI (NASDAQ:FEIC) today announced the new Apreo™ scanning electron
microscope (SEM), offering an industry-leading range of
applications. In fields ranging from materials and life sciences,
to research in semiconductor, energy, and chemistry, Apreo offers
exceptional versatility.
“Apreo was specifically designed to be the mid-range SEM tool of
choice. Its feature set and ease of use should put it at the top of
the list for our research and industrial laboratory customers that
require high performance, broad versatility and easy operation over
a wide range of applications for users with varying levels of
expertise,” said Trisha Rice, vice president and general manager of
FEI’s Materials Science Business.
Researchers and developers need to get as much microscopic
information as possible from their samples. They want to be able to
see materials contrast and determine the chemical or
crystallographic sample properties on a wide range of samples,
whether they are conductors, insulators, magnetic or beam
sensitive, and they want to do so over a wide range of conditions,
including: high- or low-vacuum and at different tilt angles. Apreo
provides this capability.
Due to its proprietary compound final lens design, the Apreo SEM
is capable of resolution down to 1.0 nm at 1 kV without the need
for beam deceleration – providing high performance on nearly any
sample, even if it is tilted or topographic. It offers backscatter
detection at the lowest beam currents, at any tilt angle, on
sensitive samples and at TV-rate imaging, so materials contrast is
strong. Detector segments can be individually addressed, which
allows researchers to optimize for angular contrast or for signal
intensity and extract the information that matters most. It
provides a wide range of approaches for dealing with insulating
samples, including a low-vacuum capability with a chamber pressure
of up to 500 Pa. Finally, Apreo is an excellent tool for
analytics, with ports for up to three energy dispersive x-ray
spectrometry (EDS) detectors, coplanar EDS & electron
backscatter diffraction (EBSD), analytics-compatible low-vacuum,
and beam currents up to 400 nA.
The Apreo software provides user guidance and “point-and-click”
navigation using an in-chamber camera, making it easy for even
novice users to get excellent results. High-productivity labs will
appreciate the ability to load multiple samples quickly and easily
without tools.
More information about the new Apreo SEM, please visit
www.fei.com/apreo.
About FEIFEI Company (Nasdaq:FEIC) designs,
manufactures and supports a broad range of high-performance
microscopy workflow solutions that provide images and answers at
the micro-, nano- and picometer scales. Its innovation and
leadership enable customers in industry and science to increase
productivity and make breakthrough discoveries. Headquartered in
Hillsboro, Ore., USA, FEI has over 2,800 employees and sales and
service operations in more than 50 countries around the world. More
information can be found at: www.fei.com.
FEI Safe Harbor Statement This news release
contains forward-looking statements that include statements
regarding the performance capabilities and benefits of the Apreo
SEM. Factors that could affect these forward-looking statements
include but are not limited to our ability to manufacture, ship,
deliver and install the tools, solutions or software as expected;
failure of the product or technology to perform as expected;
unexpected technology problems and challenges; changes to the
technology; the inability of FEI, its suppliers or project partners
to make the technological advances required for the technology to
achieve anticipated results; and the inability of the customer to
deploy the tools or develop and deploy the expected new
applications. Please also refer to our Form 10-K, Forms 10-Q, Forms
8-K and other filings with the U.S. Securities and Exchange
Commission for additional information on these factors and other
factors that could cause actual results to differ materially from
the forward-looking statements. FEI assumes no duty to update
forward-looking statements.
For more information contact:
Sandy Fewkes (media contact)
MindWrite Communications, Inc.
+1 408 224 4024
sandy@mind-write.com
FEI
Jason Willey (investors and analysts)
Sr. Director, Investor Relations & Corporate Development
+1 503 726 2533
jason.willey@fei.com
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