Cascade Microtech News (NASDAQ:CSCD)

Latest Cascade Microtech News Headlines
DateTimeSource
Headline
05/22/20089:35AMPRNUSCascade Microtech Expands Global Service and Support Footprint
BEAVERTON, Ore., May 22 /PRNewswire-FirstCall/ -- Cascade Microtech, Inc. today announced global expansion with new offices and personnel in Munich as well as Phoenix, Arizona to provide service and support for production products customers in those regions. Semiconductor manufacturers, faced with growing complexity... More...>>
05/19/200812:35PMPRNUSCascade Microtech Announces Strategic Initiative to Maximize Lab and Fab Investments via Fully Integrated Measurement Systems
New approach includes measurement accuracy assurance BEAVERTON, Ore., May 19 /PRNewswire-FirstCall/ -- In response to the ever-increasing cost associated with developing new process nodes, today Cascade Microtech announced a new initiative to develop integrated measurement systems for on-wafer semiconductor device characterization... More...>>
05/19/200812:16PMPRNUSCascade Microtech Offers Industry's First Fully Integrated Flicker Noise Measurement System
EDGE Flicker Noise Measurement System is Certified Accurate from 1Hz to 30 MHz BEAVERTON, Ore., May 19 /PRNewswire-FirstCall/ -- With the cost of developing each new semiconductor manufacturing process node escalating dramatically and time to market pressures increasing, there is no longer room for error in measuring... More...>>
04/02/20089:00AMPRNUSCascade Microtech's New P30 Pyramid Probe(R) Production Probe Card Lowers Cost of High-Volume Wafer Testing of RF Switches and F
BEAVERTON, Ore., April 2, 2008 /PRNewswire-FirstCall/ -- To address the critical need to reduce the cost of high-volume testing of RF devices for the mobile handset market, Cascade Microtech introduced today a new Pyramid Probe card that brings high performance RF production test capability with over 50 percent cost... More...>>
01/29/20087:25PMPRNUSCascade Microtech Introduces World's First 45 nm-capable DC/RF Parametric Probe Card Solutions, Lowers Cost of Ownership
BEAVERTON, Ore., Jan. 29 /PRNewswire-FirstCall/ -- Cascade Microtech today introduced two new Pyramid(R) parametric probe cards that allow single-pass high performance DC and RF measurements and reduce the cost of parametric production test for semiconductors with advanced processes nodes at 65 nm, 45 nm and beyond... More...>>
01/14/20089:00AMPRNUSCascade Microtech Wins Two Awards for Tesla On-Wafer Power Semiconductor Device Characterization System
Tesla system recognized by industry-leading publications Electronic Products and Test & Measurement World BEAVERTON, Ore., Jan. 14 /PRNewswire-FirstCall/ -- Cascade Microtech today announced it has received the prestigious Product of the Year award from key industry publication Electronic Products for its Tesla power... More...>>
01/07/200810:53AMPRNUSCascade Microtech Sets New Standard for 300mm Wafer Probing
Elite 300 yields new measurement capability vital for probing at 45nm and below BEAVERTON, Ore., Jan. 7 /PRNewswire-FirstCall/ -- Cascade Microtech today introduced the next step in 300mm wafer probe stations designed to meet the worldwide need for advanced on-wafer measurements for semiconductor devices. Based on Cascade... More...>>
12/17/20079:00AMPRNUSCascade Microtech Wins Global Technology Award for High Performance, Low Cost Test Socket
Gryphics' BGA test socket deemed 'the best in the world' by Global SMT & Packaging BEAVERTON, Ore., Dec. 17 /PRNewswire-FirstCall/ -- Cascade Microtech today announced that it has won a Global Technology Award for its Grypper(TM) ball grid array (BGA) test socket. Sponsored by Global SMT & Packaging magazine, the awards... More...>>
06/20/20072:53PMPRNUSCascade Microtech Announces $4 Million Order for 300mm Probe Stations from Leading Asian Memory Manufacturer
BEAVERTON, Ore., June 20 /PRNewswire-FirstCall/ -- Cascade Microtech today announced that it recently closed the single largest probe station order in its 23-year history -- an order in excess of U.S. $4 million to a prominent Asian memory manufacturer for S300 wafer probe stations. The sale continues Cascade Microtech's... More...>>
06/07/20076:46PMPRNUSCascade Microtech Appoints Tariq Alam as Director of Worldwide Sales and Service for Engineering Products Division
BEAVERTON, Ore., June 7 /PRNewswire-FirstCall/ -- Cascade Microtech (NASDAQ:CSCD), a worldwide leader in the precise electrical measurement of small structures, today announced the appointment of Dr. Tariq Alam as the director of worldwide sales and service for the Engineering Products Division. "We are thrilled to... More...>>
06/04/20076:00AMPRNUSCascade Microtech's WinCal XE Adds 16-term Calibration to Enhance RF Device Model Accuracy
BEAVERTON, Ore., June 4 /PRNewswire-FirstCall/ -- Cascade Microtech today added an important new capability, a 16-term calibration technique, to its WinCal XE calibration software to help semiconductor labs reduce design cycles and time to market. Using WinCal XE for on-wafer measurement helps semiconductor manufacturers... More...>>
05/28/20079:00AMPRNUSCascade Microtech Announces the Tesla Power Semiconductor Device Characterization System
BEAVERTON, Ore., May 28 /PRNewswire-FirstCall/ -- Cascade Microtech today announced its new Tesla power device characterization system. Tesla, unlike any other probing system, solves the on-wafer probing challenges for engineers and test technicians who need to characterize their power devices. The power semiconductor... More...>>
04/25/20079:00AMPRNUSCascade Microtech Pyramid Probes(R) Selected by Peregrine Semiconductor for Advanced RF IC Development
Peregrine Will Use Cascade Microtech Pyramid Probes to Test UltraCMOS(TM) High-Power Antenna Switches BEAVERTON, Ore., April 25 /PRNewswire-FirstCall/ -- Cascade Microtech, Inc. (NASDAQ:CSCD) today announced that Peregrine Semiconductor Corporation has placed a multi-million dollar order for Cascade Microtech's Pyramid... More...>>
03/23/20077:46PMPRNUSSMIC and Cascade Microtech Partner to Establish New Mixed-signal RFIC Design Service Lab in Shanghai
Cascade Microtech's industry-leading 300mm wafer-level RF test systems chosen by SMIC to enable the next generation of wireless ICs SHANGHAI, China and BEAVERTON, Ore., March 23 /PRNewswire-FirstCall/ -- Semiconductor Manufacturing International Corporation (SMIC) today announced its partnership with Cascade Microtech... More...>>
02/21/20078:00AMPRNUSAeA Oregon Council Will Host the Fifth Oregon Technology Investor Tour in August 2007
Investors and analysts encouraged to register today PORTLAND, Ore. and WASHINGTON, Feb. 21 /PRNewswire/ -- The Oregon Technology Investor Tour was started four years ago as a way to provide a unique opportunity for the financial investment community to experience Oregon public technology companies first-hand, meet their... More...>>
01/29/20074:03PMPRNUSFaster and More Accurate Wafer-level RF Measurement Enabled by New WinCal XE Software From Cascade Microtech
XE Version Adds Advanced Multi-port Calibrations, Local Data Analysis and Device Characterization Support Tools BEAVERTON, Ore., Jan. 29 /PRNewswire-FirstCall/ -- The proliferation of wireless consumer electronics devices with complex, multi-port RF architecture has pushed engineers to perform much more difficult and... More...>>
01/08/20073:10PMPRNUSCascade Microtech's Configurable M150 Measurement Platform Awarded 'Best in Test' by Test & Measurement World
BEAVERTON, Ore., Jan. 8 /PRNewswire-FirstCall/ -- When Cascade Microtech (NASDAQ:CSCD) introduced the M150 Measurement Platform in April 2006, it broke new ground in affordability and configurability. Until the M150, the concept of "all measurements on only one platform" never existed. Test & Measurement World recently... More...>>
11/30/20062:31PMPRNUSCascade Microtech Adds High-Current Model to Infinity Probe(R) Family
High-current RF Probe With Low Contact Resistance Enables Accurate On-wafer Characterization of RF Power Devices BEAVERTON, Ore., Nov. 30 /PRNewswire-FirstCall/ -- Cascade Microtech (NASDAQ:CSCD) is expanding its popular line of Infinity probes by adding a high-current model (rated two amperes) optimized for tuner-based... More...>>
09/28/20063:16PMPRNUSCascade Microtech's New Infinity Probes(R) Enable Superior Wafer-Level RF Characterization of Smaller Devices Through 220 GHz
New Infinity RF Wafer Probes Are Ideal for Probing Fine Pitch Aluminum Pads, Ensuring Low, Stable Contact Resistance and Minimal Pad Damage BEAVERTON, Ore., Sept. 28 /PRNewswire-FirstCall/ -- Cascade Microtech (NASDAQ:CSCD), a leader in wafer-level measurements on Nano-RF (nanometer RF) devices, today announced it has... More...>>
09/11/20067:00AMPRNUSCascade Microtech Announces Partnership With Philips and Agilent Technologies to Establish New Research Facility for Development
World-Class Measurement Laboratory Will Be Located at Philips Research's Microsystems Plaza in Eindhoven - One of the Largest Shared Research Service Centers in the World BEAVERTON, Ore., Sept. 11 /PRNewswire-FirstCall/ -- Cascade Microtech, (NASDAQ:CSCD), a worldwide leader in precise electrical measurements on small... More...>>


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